二硒化鉭晶體 2H-TaSe2 (Tantalum Selenide)
晶體尺寸：~10毫米
電學(xué)性能：Metal, Charge density waves (CDW) system at ~120K, Superconductor (Tc ~0.1K)
                  金屬，電荷密度波（CDW）
晶體結(jié)構(gòu)：六邊形
晶胞參數(shù)：a = b = 0.342 nm, c = 1.255 nm, α = β = 90° , γ = 120°
晶體類型：合成
晶體純度：＞99.995%

X-ray diffraction on a 2H-TaSe2 single crystal aligned along the (001) plane. XRD was performed at room temperature using a D8 Venture Bruker. The 4 XRD peaks correspond, from left to right, to (00l) with l = 2, 6, 8, 10

Powder X-ray diffraction (XRD) of a single crystal 2H-TaSe2. X-ray diffraction was performed at room temperature using a D8 Venture Bruker.

Stoichiometric analysis of a single crystal 2H-TaSe2 by Energy-dispersive X-ray spectroscopy (EDX).

Raman spectrum of a single crystal 2H-TaSe2. Measurement was performed with a 785 nm Raman system at room temperature.